Nanoscale electrical characterization of nanostrctures and devices, Kelvin probe force microscopy (KPFM), Nanowires and nanowire transistors, Solar Cells, Organic semiconductor devices and materials, Biological Field effect Transistors.
Available Research Services
We offer services for AFM and KPFM measurements-
Semiconductor and organic nano-structures characterization using ambient and ultra high vacuum (UHV) AFM and Kelvin Probe Force Microscopy (KPFM), low temperature (LT) UHV KPFM, SEM.
Time-resolved and steady-state photoluminescence in the range 400-1400 nm and at a temperature range 25-800 K
1. AFM and KPFM measurements
2. Time-resolved temperature dependent photoluminescence measurements
Prof. Yossi Rosenwaks
Department of Electrical Engineering - Physical Electronics
School of Electrical Engineering
Faculty of Engineering
Tel Aviv University
Phone : 972-3-640-6248
Email : email@example.com